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Product Description
brief introduction
Model GKT3252/3302 transformer tester is a high-precision measuring instrument with high stability and reliability, which is provided to the production line or quality control of the transformer factory for incoming and outgoing inspection. Technically, the ability to enhance the coil ratio can solve the problems of low coupling coefficient, transformer coil ratio, and coil number measurement, so as to make the measurement results more accurate. In addition to the test function of transformer scanning, the 3252/3302 also has the LCR measurement function, which is not only easy to operate, but also can reduce the cost of production equipment.
Performance characteristics
Main features and performance
■ Test frequency: 20Hz-200KHz/1MHz, accuracy 0.02%
■ Large LCD display (320 × 240 point matrix)
■ Basic measurement accuracy: 0.1%
■ Provide various standard test fixtures and special fixture customization
■ Three groups of impedance output modes are selected, and the measurement results can be completely compared with LCR tables of well-known manufacturers
■ Four-terminal test fixture can obtain accurate and stable measurement of DCR, inductance and turn ratio
■ Enhanced coil ratio accurate measurement, suitable for magnetic cores with low permeability
■ Built-in comparator, 10-level classification and counting function
■ High-speed LCR measurement, up to 80 times/second
■ 4M SRAM memory card for machine data setting and backup
■ High-speed DCR measurement, up to 50 times/second
■ Standard RS-232, HANDLER and PRINER interfaces
■ Direct control function of bias current source
■ 50 sets of internal instrument settings can be stored and called
General specifications
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Temperature&humidity |
Temperature: 10 ° C~40 ° C, humidity: 10%~90% RH |
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| Power requirements | Voltage |
90V～125Vac&190V～250Vac |
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frequency |
48Hz～62Hz |
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| power waste |
maximum140VA |
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size(W×H×D) |
430×180×320mm |
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| weight | About 8.5kg | |
technical parameter
| Model |
3252/3302 |
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| major function |
Transformer scan test+LCR test |
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Test parameters |
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| Transformer scan test |
Tnrn Ratio,Phase,Turn,L,Q |
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LK,BalanceACR,Cp,DCR |
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Pin Short |
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LCR |
L,C,R，｜Z︱ |
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Y,DCR,Q，D |
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R，X，θ |
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Test signal |
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| Test voltage |
Turn |
10mV～10V,±10%,10mV/Step |
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| other |
10mV～2V,±10%,10mV/Step |
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| Test frequency |
Turn |
3252；1KHz-200KHz,±0.02% |
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3302；1KHz～1MHz,±0.02%Resolution：0.01Hz |
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| other |
3252；20Hz-200KHz,±0.02% |
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3302；20Hz～1MHz,±0.02%Resolution：0.01Hz |
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| Output impedance |
Turn |
10，When the test position is accurate≤2V |
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50,When the test position is accurate＞2V |
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| other |
Constant=OFF；Depending on the resistance range |
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Constant=320×：100Ω0.5% |
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Constant=107×:25Ω±0.5% |
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Constant=106×:50Ω100mA±0.5%(1Vset up） |
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Inductive load is less than10Ω，10Ω±10%，impedance≥10Ω |
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Measurement display range |
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L.LK |
0.00001μH～9999.99H |
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C |
0.00001pF～999.999mF |
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Q.D |
0.00001～99999 |
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Z.X.R |
0.00001Ω～99.9999MΩ |
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Y |
0.01nS～99.9999S |
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θ |
-90.00～+90.00 |
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DCR |
0.01mΩ～99.999MΩ |
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Turn |
0.01～99999.99circle（Secondary voltage is less than100Vrms) |
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Pin-short |
11group，Between pins |
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Basic accuracy |
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L.LK.C.Z.X.Y.R.DCR |
0.1%（If AC parameter1KHz） |
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Q.D |
0.0005(1KHz) |
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θ |
0.03°(1KHz) |
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Turn |
0.5%(1KHz) |
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Measurement speed (fastest) |
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L.LK.C.Z.X.Y.R.D |
80meas./sec |
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DCR |
50meas./sec |
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Turn |
10meas./sec |
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Determination method |
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| Transformer scan test |
The good/bad product judgment of each test parameter is output by the selected processor interface |
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| LCR test |
The 10-level classification and total number are output by the selected processor interface |
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Good/bad product judgment is output by the standard processor interface |
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| Display correction function |
three hundred and twenty × 240 dot matrix LCD |
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Open/short return to zero, load correction |
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Memory |
50 sets of instrument settings, which can be expanded by memory card | |||
| Equivalent circuit mode |
Series connection |
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trigger |
Internal, manual, external | |||
ordering information
G3252 comprehensive tester
G3302 comprehensive tester
Instrument accessories
Four-end test fixture
Test fixture (5MM)
Optional Accessories
SMD 元件测试夹
| SMD element test clamp 1A built-in bias card Scanning test box (3001A) |
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Shenzhen Gain KaiTa Electronics Co., Ltd.
Email：xcc0310@gkt.com.cn
Fax：0755-27882561
Address: 3rd Floor, Block A, Building B2, Anle Industrial Zone, No.172 Hangcheng Avenue, Baoan District, Shenzhen
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